| Paper/presentation details | Speaker | Partner | Event title | Date | Place | | A Flash Light in Europe | Livio Baldi | NUMONYX | ENIAC Forum | 2007 | Budapest, Hungaria | | TaN metal gate damage during high-k (Al2O3) high-temperature etch | J. Paul | CNT | MNE08 | 15/09/08 - 18/09/08 | Athens, Greece | | | | ESREF | 29/09/08 - 02/10/08 | Maastricht, The Netherlands | Electrical characterization of Zirconium Oxide
and Lanthanum Aluminate for applications in
non-volatile memories | Gabriele Congedo | CNR | MIGAS 2008 Summer school: "Nanoscale CMOS and Si-based Beyond CMOS Nanodevices" | 28/06/08 - 04/07/08 | Grenoble, France | Application of Franz Dispersion Relation in Simulations
of Tunneling Transport in MIS and SONOS/TANOS Structures | M. I. Vexler | TUBS | IWDTF-08 - Dielectric Thin Films for Future ULSI Devices: Science and Technology" | 05/11/08 - 07/11/08 | Tokyo, Japan | | Characterization of high dielectric constant materials for applications in next generation non-volatile memories | G. Congedo | CNR | Seminar, Lecce University | 10/11/2008 | Lecce, Greece | Accurate program simulation of TANOS charge
trapping devices | Thomas Melde | CNT, TUBAF | NVMTS2008 | 15/11/2008 | Monterey, USA | | poster presentation | Livio Baldi | NUMONYX | ICT event 2008 | Lyon, France | | | GOSSAMER presentation | | | IMST 2008 workshop on Flash memories | 26/11/08 - 27/11/08 | | | | | IEEE SISC | 11/12/08 - 13/12/08 | San Diego, USA | | “A new physics-based model for TANOS memories program/erase,” A. Mauri, C. Monzio Compagnoni, S. Amoroso , A. Maconi , F. Cattaneo, A. Benvenuti, A. S. Spinelli , A. L. Lacaita | A. Mauri | IUNET, NUMONYX | IEEE IEDM, San Francisco, CA, USA | 15/12/08 - 17/12/08 | San Francisco, USA | Impact of the Charge Transport in the Conduction
Band on the Retention of Si?Nitride Based Memories | E.Vianello | IUNET | ESSDERC | 14/09/2008-18/09/2008 | Athens, Greecs |
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